Author

M.R. Mercer

56 papers · 1984–2014

1984peak 18 in 20022014

Frequent co-authors

Papers

showing 1–25 of 56 RSS

A topological search algorithm for ATPG

Tom Kirkland, M.R. Mercer

Hardware and Architecture · 1987 · cited 269× · DOI ↗ · more like this ·

The automatic generation of tests for combinational digital circuits is examined from the standpoint of a guided search through a search space. The limitations of this process, namely the size of the search space and the overall strategy, are identified and methods are presented to reduce the size of the search space as well as produce a more optimal ordering of node assignments. A new algorithm is proposed that uses the smaller search space and the improved ordering for node assignments based on a topological analysis of the circuit. Results are presented indicating that this new algorithm, termed TOPological Search (TOPS), is faster than existing algorithms and also rapidly identifies many redundant faults without search.

REDO-random excitation and deterministic observation-first commercial experiment

Michael R. Grimaila, Sooryong Lee, Jennifer Dworak +8 more

Hardware and Architecture · 20 Jan 2003 · cited 116× · DOI ↗ · more like this ·

For many years, non-target detection experiments have been simulated by using AND/OR bridges or gross delay faults as surrogates. For example, the defective part level can be estimated based upon surrogate detection when test patterns target stuck-at faults in the circuit. For the first time, test pattern generation techniques that attempt to maximize non-target defect detection have been used to test a real, 100% scanned, commercial chip consisting of 75 K logic gates. In this experiment, the defective part level for REDO-based patterns was 1,288 parts per million lower than that achieved by DC stuck-at based patterns generated using today's state of the art tools and techniques.

Statistical delay fault coverage and defect level for delay faults

E.S. Park, M.R. Mercer, T.W. Williams

Hardware and Architecture · 6 Jan 2003 · cited 88× · DOI ↗ · more like this ·

A quantitative delay fault coverage model is discussed to provide a figure of merit for delay testing. System sensitivity of a path to a delay fault along that path and the effectiveness of a delay test are described in terms of the propagation delay of the path under test and the delay defect size. A statistical delay fault coverage model is established. A defect-level model is also proposed as a function of the yield of a manufacturing process and the statistical delay fault coverage.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

The interdependence between delay-optimization of synthesized networks and testing

T.W. Williams, B. Underwood, M.R. Mercer

Hardware and Architecture · 1991 · cited 72× · DOI ↗ · more like this ·

As CAD tools become more sophisticated, they can synthesize logic netivorks that more nearly optimize the circuit area resources to maximize operating speeds. In this work we show, through formal arguments, that the path delays in such optimized networks will follow a more compact distribution and, in the extreme in some networks, will all be equal to the m"mum delay through the network (cycle time). The impact of this type of synthesized network on delay testing will be shown and compared to the case for nonoptim"zed designs. Finally, recommendations will be made on how network tim"ng optimization can be abne in such a way as to minimize the adverse impact on product yield.

A method of delay fault test generation

C.T. Glover, M.R. Mercer

Hardware and Architecture · 6 Jan 2003 · cited 58× · DOI ↗ · more like this ·

The authors propose an efficient deterministic method of delay fault test generation. For most common circuits, the proposed technique has a time complexity which is polynomial in the size of the circuit, as opposed to existing deterministic methods which, for nearly all circuits, are exponential. They define a type of transition path, the fully transitional path (FTP), and demonstrate that it has several useful properties. An FTP can be created by applying a vector pair derived from a stuck-at test for a primary input. The authors extend this method by using an alternate representation for switching functions, the binary decision diagram, to generate graphs representing stuck-at-tests. The concept of free variables is defined as a tool for deriving several FTPs from one stuck-at test. Preliminary results are presented which indicate that the method provides a higher robust delay fault…

An efficient delay test generation system for combinational logic circuits

Eun Sei Park, M.R. Mercer

Hardware and Architecture · 1990 · cited 45× · DOI ↗ · more like this ·

This paper presents an efficient delay test generation system for combinational logic circuits. Delay testing problems are divided into gross delay fault testing and small delay fault testing in order to explore the trade-off between the levels of delay testing effort and the confidence levels of proper system operation. Complete automatic test pattern generation algorithms are proposed for both gross delay faults and small delay faults. Especially for the small delay fault test generation, new search space enumeration techniques are employed so as to bias the search space such that a delay test for relatively long paths can be found. Also a novel timing analysis method via functionality check is presented for delay test generation. Finally, complete test results are demonstrated for both gross delay faults and small delay faults on several benchmark circuits.

A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults

Sooryong Lee, B. Cobb, Jennifer Dworak +2 more

Hardware and Architecture · Design, Automation, and Test in Europe · 4 Mar 2002 · cited 44× · DOI ↗ · more like this ·

Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of each fault site lead to increased test set size and require more tester memory. In this paper we propose a new ATPG algorithm to find a near-minimal test pattern set that detects faults multiple times and achieves excellent defective part level. This greedy approach uses 3-value fault simulation to estimate the potential value of each vector candidate at each stage of ATPG. The result shows generation of a close to minimal vector set is possible only using dynamic compaction techniques in most cases. Finally, a systematic method to trade-off between defective part level and test size is also presented.

A statistical model for delay-fault testing

E.S. Park, M.R. Mercer, T.W. Williams

Hardware and Architecture · IEEE Design & Test of Computers · February 1989 · cited 39× · DOI ↗ · more like this ·

The authors propose a statistical model for measuring delay-fault coverage. The model provides a figure of merit for delay testing in the same way that fault coverage provides one for the testing of single stuck-at faults. The mode measures test effectiveness in terms of the propagation delay of the path to be tested, the size of the delay defect, and the system clock interval, and then combines the data for all delay faults to measure total delay-fault coverage. The authors also propose a model for measuring the defect level as a function of the manufacturing yield and the predictions of the statistical delay-fault coverage model.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

The total delay fault model and statistical delay fault coverage

E.S. Park, M.R. Mercer, T.W. Williams

Hardware and Architecture · IEEE Transactions on Computers · June 1992 · cited 35× · DOI ↗ · more like this ·

Delay testing at the operational system clock rate can detect system timing failures caused by delay faults. However, delay fault coverage in terms of the percentage of the number of tested faults may not be an effective measure of delay testing. A quantitative delay fault coverage model to provide a figure of merit for delay testing is presented. System sensitivity of a path to a delay fault along that path and the effectiveness of a delay test are described in terms of the propagation delay of the path under test and the delay defect size. A new statistical delay fault coverage model is established. A defect level model is also proposed as a function of the yield of a manufacturing process and the new statistical delay fault coverage. A new delay testing strategy driven by the defect level for delay faults is proposed.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML"…

Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D

Jennifer Dworak, Michael R. Grimaila, Sooryong Lee +2 more

Hardware and Architecture · 8 Nov 2002 · cited 34× · DOI ↗ · more like this ·

Predicting the final value of the defective part level after the application of a set of test vectors is not a simple problem. In order for the defective part level to decrease, both the excitation and observation of defects must occur. This research shows that the probability of exciting an as yet undetected defect does indeed decrease exponentially as the number of observations increases. In addition, a new defective part level model is proposed which accurately predicts the final defective part level (even at high fault coverages) for several benchmark circuits and which continues to provide good predictions even as changes are made an the set of test patterns applied.

Algorithms for automatic test-pattern generation

Tom Kirkland, M.R. Mercer

Hardware and Architecture · IEEE Design & Test of Computers · June 1988 · cited 33× · DOI ↗ · more like this ·

Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes the way each algorithm uses search and backtracking techniques to sensitize a fault and propagate it to an observable point. The heuristics used to guide ATPG search and the notation used to represent circuit values are examined.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

Code coverage, what does it mean in terms of quality?

T.W. Williams, M.R. Mercer, J. Mucha +1 more

Software · 13 Nov 2002 · cited 32× · DOI ↗ · more like this ·

Unit code test coverage has long been known to be an important metric for testing software, and many development groups require 85% coverage to achieve quality targets. Assume we have a test, T/sub 1/ which has 100% code coverage and it detects a set of defects, D/sub 1/. The question, which is answered here, is "What percentage of the defects in D/sub 1/ will be detected if a random subset of the tests in T/sub 1/ are applied to the code, which has code coverage of X% of the code?" The purpose of this paper is to show the relation between code quality and code coverage. The relationship is derived via a model of code defect levels. A sampling technique is employed and modeled with the hypergeometric distribution while assuming uniform probability and a random distribution of defects in the code, which invokes the binomial distribution. The result of this analysis is a simple relation…

Delay Testing Quality in Timing-Optimized Designs

Eun Sei Park, B. Underwood, T.W. Williams +1 more

Hardware and Architecture · 24 Aug 2005 · cited 31× · DOI ↗ · more like this ·

As electronic CAD synthesis tools become more powerful, they will increasingly refine delay measiirements and adjust path delays so as to increase the clock rate or to reduce the chip area. This paper discusses the implications of such events on testing for delay defects. We provide a timing optimization procedure and show that the resultant density function of path delays is a delta function. Finally, we discuss the impact of timing optimization on the yield of a manufacturing process and the defect level for delay faults.

Limitations in predicting defect level based on stuck-at fault coverage

Jihun Park, M. Naivar, R. Kapur +2 more

Hardware and Architecture · 17 Dec 2002 · cited 29× · DOI ↗ · more like this ·

The stuck-at fault model has been used over decades as a guide to the test generation process and as an evaluation mechanism for the quality of the test set. As demands on quality have increased, the use of the stuck-at fault model as a predictor of the defect level has been questioned. This paper provides some insight on the issue and shows the limitations of using the stuck-at fault coverage to predict the defect level. The authors demonstrate that as defect level decreases the uncertainty of the estimate grows.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

All Tests for a Fault are Not Eyually Valuable for Defect Detection

R. Kapur, Jaehong Park, M.R. Mercer

Hardware and Architecture · 24 Aug 2005 · cited 26× · DOI ↗ · more like this ·

The standard approach to generating a test set for a logic circuit is to select a set of target fault,s and generate one test for each fault (or at least most of the faults). By far, the most common target fault set is composed of single stuck-at faults. However, many potential manufacturing (non-target) defects are not included in the target fault set, so that their detection is just a fortuitous coincidence. In most cases, many different tests may exist which detect a given single stuck-at fault. However, each of these tests (for the same stuck-at fault) may perform very differently in terms of their non-target defect detection. We investigate this phenomenon empirically using a subset of the ISCXS 85 benchmark circuits, and our results show that extremely wide variations in defective part level are possible over sets of tests which all guarantee 100% single non-redundant stuck-at…

Using target faults to detect non-target defects

Li-C. Wang, M.R. Mercer, T.W. Williams

Hardware and Architecture · 23 Dec 2002 · cited 26× · DOI ↗ · more like this ·

The traditional ATPG method relies upon faults to target all defects. Since faults do not model all possible defects, testing quality depends on the fortuitous detection of non-target defects. By analyzing different ATPG approaches, this paper intends to identify critical factors that may greatly affect the fortuitous detection. For enhancing the fortuitous detection of non-target defects through target faults, new concepts and novel ATPG methods are proposed.

Functional approaches to generating orderings for efficient symbolic representations

M.R. Mercer, R. Kapur, D.E. Ross

Computational Theory and Mathematics · [1992] Proceedings 29th ACM/IEEE Design Automation Conference · 2 Jan 2003 · cited 25× · DOI ↗ · more like this ·

The authors present a functional approach to generating orderings for representing functions. They develop a cost function which closely mimics the ordered binary decision diagram operations and can be quickly computed. Using the cost as a metric for an ordering, an annealing procedure was used to arrive at good variable orderings. The results obtained by simulated annealing are compared to orderings generated from heuristics that use circuit topology to arrive at a variable ordering.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

A deterministic approach to adjacency testing for delay faults

Clive Glover, M.R. Mercer

Hardware and Architecture · 1989 · cited 25× · DOI ↗ · more like this ·

Adjacency testing for delay faults is examined in both theory and implementation. We shall show that the necessary and sufficient conditions for adjacency testability yield an efficient method of robust delay test generation. Empirical results (including several different cost measurements) are presented which demonstrate that our technique: (1) achieves high fault coverages under both the robust and nonrobust delay fault models and (2) is cost effective.

Enhancing test efficiency for delay fault testing using multiple-clocked schemes

Jing-Jia Liou, Li-C. Wang, Kwang‐Ting Cheng +4 more

Hardware and Architecture · Proceedings - ACM IEEE Design Automation Conference · 2002 · cited 21× · DOI ↗ · more like this ·

In conventional delay testing, the test clock is a single pre-defined parameter that is often set to be the same as the system clock. This paper discusses the potential of enhancing test efficiency by using multiple clock frequencies. The intuition behind our work is that for a given set of AC delay patterns, a carefully-selected, tighter clock would result in higher effectiveness to screen out the potential defective chips. Then, by using a smarter test clock scheme and combining with a second set of AC delay patterns, the overall quality of AC delay test can be enhanced while the cost of including the second pattern set can be minimized. We demonstrate these concepts through analysis and experiments using a statistical timing analysis framework with defect-injected simulation.

Least upper bounds on OBDD sizes

M.A. Heap, M.R. Mercer

Computational Theory and Mathematics · IEEE Transactions on Computers · June 1994 · cited 20× · DOI ↗ · more like this ·

This paper derives exact equations for the maximum number of nonterminal vertexes in reduced and quasi-reduced ordered binary decision diagrams (OBDD's). A reduced OBDD is reduced by both merging and deleting vertices, and a quasi-reduced OBDD is reduced only by merging. These formulas are used to tighten Lee's original bounds, and to correct the bounds recently reported by H.T. Liaw and C.S. Lin (1992).< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

On efficiently and reliably achieving low defective part levels

Li-C. Wang, T.W. Williams, M.R. Mercer

Hardware and Architecture · 19 Nov 2002 · cited 19× · DOI ↗ · more like this ·

How can we guarantee that a testing method will stably and efficiently achieve a very low defective part level? Traditional testing methods rely upon faults to model all defects. As technology advances, this approach becomes increasingly questionable. If only a subset of defects are modeled as faults, then as fault coverage approaches 100%, the tests mill be more and more biased in favor of fault detection. Unfortunately, this reduces the testing efficiency for defects and limits the quality level that we can achieve. In this paper, we propose models for the testing process and suggest a solution which we call "unbiased test generation". We define two types of testing bias, and these new metrics can be used to compare and evaluate test generation methods in practice.

Fast functional evaluation of candidate OBDD variable orderings

D.E. Ross, K.M. Butler, R. Kapur +1 more

Signal Processing · 9 Dec 2002 · cited 18× · DOI ↗ · more like this ·

Symbolic simulation via ordered binary decision diagrams (OBDDs) is becoming more feasible each year. These representations are often very efficient under an appropriate ordering of the variables of the functions represented. Recently, heuristics for ordering variables have been developed, but due to the nature of heuristics, no single heuristic always produces an appropriate ordering. The authors develop and analyze a technique for selecting the best of several candidate orderings. The ordering selection method is fast. Its ranking of an ordering is compared to the actual performance of an ordering during functionals (OBDD) calculations in circuits from the ISCAS85 combinational benchmarks. Compared to any previously published single ordering heuristic, the method allows OBDD calculations using less cumulative memory over all six circuits investigated, and also produces over an order…

A novel clocking technique for VLSI circuit testability

M.R. Mercer, Vishwani D. Agrawal

Hardware and Architecture · IEEE Journal of Solid-State Circuits · April 1984 · cited 17× · DOI ↗ · more like this ·

Scan-testable digital designs have a special `scan' operating mode to set and read the states of flip-flops in the circuit. All previous scan-testable design implementations required at least one additional input pin to specify either scan or normal operating mode, and this mode specification signal had to be routed to every flip-flop. A new clocking structure is described which eliminates these requirements for certain designs with static flip-flops that are controlled by two independent signals (master clock and slave clock). This is possible because, in normal circuit operation, the master and slave clocks are never simultaneously active. The new clocking structure uses the `all clocks active' condition to specify the scan mode. Implementation of the concept is discussed in detail for two-clock circuits. Single-clock circuits can be modified to use this scheme, and the results for…

CATAPULT: concurrent automatic testing allowing parallelization and using limited topology

Rhonda Gaede, M.R. Mercer, Kenneth M. Butler +1 more

Hardware and Architecture · 6 Jan 2003 · cited 16× · DOI ↗ · more like this ·

An improved algorithm is presented for identifying redundant faults and finding tests for hard faults in combination circuits. A concurrent approach is proposed which is based on the concepts of functional decomposition, explicit representation of fanout stems, and the Boolean difference. The data structure used is the binary decision diagram. The algorithm operates as a back end to test generators which use random patterns or heuristics or a combination of the two.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>

An optimal test pattern selection method to improve the defect coverage

Yu‐Xin Tian, M.R. Grimaila, Weiping Shi +1 more

Hardware and Architecture · 6 Feb 2006 · cited 15× · DOI ↗ · more like this ·

It is well known that n-detection test sets are effective to detect unmodeled defects and improve the defect coverage. However, in these sets, each of the n-detection test patterns has the same importance on the overall test set performance. In other words, the test pattern that detects a fault for the first time plays the same important role as the test pattern that detects that fault for the (n)-th time. In this paper, we propose a linear programming-based optimal test pattern selection method which aims at reducing the overall defect part level (DPL). Using resistive bridge faults as surrogates, our experimental results on ISCAS85 circuits demonstrate the proposed test pattern selection method achieves higher defect coverage than traditional n-detection method.