EMAT Based Ultrasonic System for Determination of Thickness Variation in Metallic Samples
Ritish Kumar, Deepa A. Joshi, Yudhisther Kumar +2 more
Thickness measurement is an important primary measurement parameter. It itself and from the various derived para-meters, provides valuable information in testing and process industries. Although numerous techniques are avail-able for thickness measurement which provide very good results for transparent material and when both sides are accessible, but these methods have limitations in case of opaque material and when only one side is accessible. A new EMAT based non contact technique is reported in this paper which is capable of measuring thickness variation even in opaque material and if only one side is accessible. Using EMAT it was possible to measure the thickness of a material in the order of a few nanometers. This was achi-evable by the facility developed at NPL, India to measure ultrasonic Time of Flight (TOF) to an accuracy of nano-seconds with deviation of 300 picoseconds. An…