Author

Kajihara

331 papers · 1988–2026

1988peak 27 in 20022026

Frequent co-authors

Papers

showing 1–25 of 331 RSS

Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits

Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita +1 more

Hardware and Architecture · 1993 · cited 223× · DOI ↗ · more like this ·

Article Cost-effective generation of minimal test sets for stuck-at faults in combinational logic circuits Share on Authors: Seiji Kajihara View Profile , Irith Pomeranz View Profile , Kozo Kinoshita View Profile , Sudhakar M. Reddy View Profile Authors Info & Claims DAC '93: Proceedings of the 30th international Design Automation ConferenceJuly 1993 Pages 102–106https://doi.org/10.1145/157485.164617Online:01 July 1993Publication History 45citation336DownloadsMetricsTotal Citations45Total Downloads336Last 12 Months1Last 6 weeks0 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New…

Real-world applications of analog and digital evolvable hardware

T. Higuchi, Masaya Iwata, Didier Keymeulen +8 more

Artificial Intelligence · IEEE Transactions on Evolutionary Computation · 1999 · cited 181× · DOI ↗ · more like this ·

In contrast to conventional hardware where the structure is irreversibly fixed in the design process, evolvable hardware (EHW) is designed to adapt to changes in task requirements or changes in the environment, through its ability to reconfigure its own hardware structure dynamically and autonomously. This capacity for adaptation, achieved by employing efficient search algorithms based on the metaphor of evolution, has great potential for the development of innovative industrial applications. This paper introduces EHW chips and six applications currently being developed as part of MITI's Real-World Computing Project; an analog EHW chip for cellular phones, a clock-timing architecture for Giga hertz systems, a neural network EHW chip capable of autonomous reconfiguration, a data compression EHW chip for electrophotographic printers, and a gate-level EHW chip for use in prosthetic hands…

On low-capture-power test generation for scan testing

Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara +3 more

Hardware and Architecture · Institutional Repositories DataBase (IRDB) · 27 Jul 2005 · cited 165× · DOI ↗ · more like this ·

Research on low-power scan testing has been focused on the shift mode, with little or no consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR drop, resulting in significant yield loss. This paper addresses this problem with a novel low-capture-power X-filling method by assigning 0's and 1's to unspecified (X) bits in a test cube to reduce the switching activity in capture mode. This method can be easily incorporated into any test generation flow, where test cubes are obtained during ATPG or by X-bit identification. Experimental results show the effectiveness of this method in reducing capture power dissipation without any impact on area, timing, and fault coverage.

Low-capture-power test generation for scan-based at-speed testing

Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima +4 more

Hardware and Architecture · Institutional Repositories DataBase (IRDB) · 6 Feb 2006 · cited 127× · DOI ↗ · more like this ·

Scan-based at-speed testing is a key technology to guarantee timing-related test quality in the deep submicron era. However, its applicability is being severely challenged since significant yield loss may occur from circuit malfunction due to excessive IR drop caused by high power dissipation when a test response is captured. This paper addresses this critical problem with a novel low-capture-power X-filling method of assigning 0's and 1's to unspecified (X) bits in a test cube obtained during ATPG. This method reduces the circuit switching activity in capture mode and can be easily incorporated into any test generation flow to achieve capture power reduction without any area, timing, or fault coverage impact. Test vectors generated with this practical method greatly improve the applicability of scan-based at-speed testing by reducing the risk of test yield loss.

Invisible delay quality - SDQM model lights up what could not be seen

Yasuo Satô, Shuji Hamada, Toshiyuki Maeda +3 more

Hardware and Architecture · 6 Feb 2006 · cited 120× · DOI ↗ · more like this ·

The quality of delay testing focused on small delay defects is not clear when traditional fault models are used. We therefore evaluated the feasibility of using the statistical delay quality model (SDQM) - which reflects fabrication process quality, design delay quality, test timing accuracy, and test pattern quality - by using a commercial automatic test program generation (ATPG) tool to apply it to a large data set. The SDQM can also provide a measure predicting the defect level of a chip, and by simulating test patterns we show experimentally here that this measure can be calculated within a reasonable CPU time when using a reasonable amount of memory. Because we found when using SDF information to calculate path lengths accurately that the transition test patterns are not good at detecting small delay defects in long paths, a new test algorithm that detects small delay defects…

XID: Don't Care Identification of Test Patterns for Combinational Circuits

Kohei Miyase, Seiji Kajihara

Hardware and Architecture · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · February 2004 · cited 102× · DOI ↗ · more like this ·

Given a test set for stuck-at faults of a combinational circuit or a full-scan sequential circuit, some of the primary input values may be changed to the opposite logic values without losing fault coverage. We can regard such input values as don't care (X). In this paper, we propose a method for identifying the X inputs of test vectors in a given test set. While there are many combinations of X inputs in the test set generally, the proposed method finds one including as many X inputs as possible, by using fault simulation and procedures similar to implication and justification of automatic test pattern generation (ATPG) algorithms. Experimental results for ISCAS benchmark circuits show that approximately 69% of the inputs of uncompacted test sets could be X on the average. Even for highly compacted test sets, the method found that approximately 48% of inputs are X.

On test data volume reduction for multiple scan chain designs

S.M. Reddy, Kohei Miyase, Seiji Kajihara +1 more

Hardware and Architecture · ACM Transactions on Design Automation of Electronic Systems · October 2003 · cited 96× · DOI ↗ · more like this ·

We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. The metric compares the achieved compression to the compression which is intrinsic to the use of multiple scan chains. We also propose a procedure for modifying a given test set so as to achieve reductions in test data volume assuming a combinational decompressor circuit.

A New ATPG Method for Efficient Capture Power Reduction During Scan Testing

Xiaoqing Wen, Seiji Kajihara, Kohei Miyase +5 more

Hardware and Architecture · Institutional Repositories DataBase (IRDB) · 25 May 2006 · cited 91× · DOI ↗ · more like this ·

High power dissipation can occur when the response to a test vector is captured by flip-flops in scan testing, resulting in excessive JR drop, which may cause significant capture-induced yield loss in the DSM era. This paper addresses this serious problem with a novel test generation method, featuring a unique algorithm that deterministically generates test cubes not only for fault detection but also for capture power reduction. Compared with previous methods that passively conduct X-filling for unspecified bits in test cubes generated only for fault detection, the new method achieves more capture power reduction with less test set inflation. Experimental results show its effectiveness.

Test vector modification for power reduction during scan testing

Seiji Kajihara, Kunio Ishida, Kohei Miyase

Hardware and Architecture · 25 Jun 2003 · cited 85× · DOI ↗ · more like this ·

This paper presents a test vector modification method for reducing power dissipation during test application for a full-scan circuit. The method first identifies a set of don't care (X) inputs of given test vectors, to which either logic value 0 or 1 can be assigned without losing fault coverage. Then, the method reassigns logic values to the X inputs so as to decrease switching activity of the circuit during scan shifting. Experimental results for benchmark circuits show the proposed method could decrease switching activity of a given test set to 48% of the original test set.

Multiple elliptic hypergeometric series --An approach from the Cauchy determinant--

Yasushi Kajihara, Masatoshi Noumi

math.CA · June 2003 · cited 85× · arXiv ↗ · more like this ·

A multiple generalization of elliptic hypergeometric series is investigated and a duality transformation for multiple hypergeometric series is proposed. Our duality transformation obtained from an identity arising from the Cauchy determinant formula for Weierstrass sigma functions, by spcialization of a particular form.

Selection of potentially testable path delay faults for test generation

Akira Murakami, Seiji Kajihara, Tetsuo Sasao +2 more

Hardware and Architecture · 8 Nov 2002 · cited 83× · DOI ↗ · more like this ·

We present a method of path selection and test generation for path delay faults. The proposed method addresses the fact that logic circuits typically have very large numbers of paths, and a large percentage of these paths are typically untestable. The proposed method selects a set of potentially testable long paths by utilizing non-enumerative identification of untestable paths and removing untestable paths from consideration. Test generation is also applied as part of the proposed method. We demonstrate the effectiveness of the method by presenting results for benchmark circuits.

Compact test sets for high defect coverage

S.M. Reddy, Irith Pomeranz, Seiji Kajihara

Hardware and Architecture · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1997 · cited 80× · DOI ↗ · more like this ·

It was recently observed that, in order to improve the defect coverage of a test set, test generation based on fault models such as the single-line stuck-at model may need to be augmented so as to derive test sets that detect each modeled fault more than once. In this work, we report on test pattern generators for combinational circuits that generate test sets to detect each single line stuck-at fault a given number of times. Additionally, we study the effects of test set compaction on the defect coverage of such test sets. For the purpose of experimentation, defect coverage is measured by the coverage of surrogate faults, using a framework proposed earlier. Within this framework, we show that the defect coverage does not have to be sacrificed by test compaction if the test set is computed using appropriate test generation objectives. Moreover, two test sets generated using the same…

A novel scheme to reduce power supply noise for high-quality at-speed scan testing

Xiaoqing Wen, Kohei Miyase, Seiji Kajihara +5 more

Hardware and Architecture · HAL (Le Centre pour la Communication Scientifique Directe) · 2007 · cited 78× · DOI ↗ · more like this ·

High-quality at-speed scan testing, characterized by high small-delay-defect detecting capability, is indispensable to achieve high delay test quality for DSM circuits. However, such testing is susceptible to yield loss due to excessive power supply noise caused by high launch-induced switching activity. This paper addresses this serious problem with a novel and practical post-ATPG X-filling scheme, featuring (1) a test relaxation method, called path keeping X-identification, that finds don't-care bits from a fully-specified transition delay test set while preserving its delay test quality by keeping the longest paths originally sensitized for fault detection, and (2) an X-filling method, called justification-probability-based fill (JP-fill), that is both effective and scalable for reducing launch-induced switching activity. This scheme can be easily implemented into any ATPG flow to…

On identifying don't care inputs of test patterns for combinational circuits

Seiji Kajihara, Kohei Miyase

Hardware and Architecture · International Conference on Computer Aided Design · 4 Nov 2001 · cited 70× · DOI ↗ · more like this ·

Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’t care (X). In this paper, we propose a method for identifying X inputs of test vectors in a given test set. While there are many combinations of X inputs in the test set generally, the proposed method finds one including X inputs as many as possible, by using fault simulation and procedures similar to implication and justification of ATPG algorithms. Experimental results for ISCAS benchmark circuits show that approximately 66 % of inputs of un-compacted test sets could be X in average. Even for compacted test sets, the method found that approximately 47 % of inputs are X. Finally, we discuss how logic values are reassigned to the identified X inputs where

A method for identifying robust dependent and functionally unsensitizable paths

Seiji Kajihara, K. Kinoshita, Irith Pomeranz +1 more

Hardware and Architecture · 22 Nov 2002 · cited 65× · DOI ↗ · more like this ·

It has been shown previously that a logic circuit often contains a large number of logical paths that need not be tested to verify the timing behavior of the circuit, if the other paths are robustly tested. These paths are called robust dependent. A subset of the robust dependent paths are the functionally unsensitizable paths. This paper proposes a method for efficiently identifying both types of paths. The proposed procedure uses local circuit analysis to keep the run time relatively low, and relatively independent of the number of paths in the circuit. The method may not identify all the paths that are robust dependent or functionally unsensitizable, however, experimental results show that the numbers it finds are comparable, and sometimes even higher than those found by other methods. The procedure can be applied to circuits that cannot be handled by other methods.

The GRD chip: genetic reconfiguration of DSPs for neural network processing

Masahiro Murakawa, S. Yoshizawa, Isamu Kajitani +4 more

Artificial Intelligence · IEEE Transactions on Computers · June 1999 · cited 57× · DOI ↗ · more like this ·

This paper describes the GRD (Genetic Reconfiguration of DSPs) chip, which is evolvable hardware designed for neural network applications. The GRD chip is a building block for the configuration of a scalable neural network hardware system. Both the topology and the hidden layer node functions of a neural network mapped on the GRD chips are dynamically reconfigured using a genetic algorithm (GA). Thus, the most desirable network topology and choice of node functions (e.g., Gaussian or sigmoid function) for a given application can be determined adaptively. This approach is particularly suited to applications requiring the ability to cope with time-varying problems and real-time constraints. The GRD chip consists of a 100 MHz 32-bit RISC processor and 15 33 MHz 16-bit DSPs connected in a binary-tree network. The RISC processor is the NEC V830 which executes mainly the GA. According to…

Random access scan: a solution to test power, test data volume and test time

Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara

Hardware and Architecture · 3 Jun 2004 · cited 54× · DOI ↗ · more like this ·

Adherence to serial scan is preventing the researchers from investigating alternative design for test techniques that may offer larger test benefit at the cost of some what higher overhead. In this paper, we investigate the use of random access scan for simultaneous reduction of test power, test data volume and test application time. We provide an asymmetric traveling salesman formulation of these problems to minimize random access scans and the test data. Application of our method results into nearly 3/spl times/ speedup in test application time, 60% reduction in test data volume and over 99% reduction in power consumption for benchmark circuits.

Critical-path-aware <i>X</i> -filling for effective IR-drop reduction in at-speed scan testing

Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki +3 more

Hardware and Architecture · Proceedings - ACM IEEE Design Automation Conference · 2007 · cited 52× · DOI ↗ · more like this ·

IR-drop-induced malfunction is mostly caused by timing violations on activated critical paths during the capture cycle of at-speed scan testing. A critical-path-aware X-filling method is proposed for reducing IR-drop, especially on gates that are close to activated critical paths, thus effectively preventing test-induced yield loss.

Evaluation of the statistical delay quality model

Yasuo Satô, Shuji Hamada, Toshiyuki Maeda +2 more

Hardware and Architecture · 2005 · cited 49× · DOI ↗ · more like this ·

In this paper we introduce a quality model that reflects fabrication process quality, design delay margin, and test timing accuracy. The model provides a measure that can predict the level of chip defects that cause delay failure, including marginal delay. We can therefore use the model to make test vectors that are effective in terms of both testing cost and chip quality. The results of experiments using ISCAS89 benchmark data and some large industrial design data reflect various characteristics of our statistical delay quality model.

Optimal scan tree construction with test vector modification for test compression

Miyase, Kajihara

Hardware and Architecture · 2003 · cited 49× · DOI ↗ · more like this ·

This paper presents a method to reduce test data volume and test application time for a full-scan circuit. The proposed method constructs a scan tree in which scan flip-flops are placed and routed in a tree structure. Although one scan input to the scan tree drives several scan chains with varying length, it is guaranteed that every test vector of a test set can be loaded into the scan tree. Since the height of the scan tree decides test data volume of the test set, the method modifies the test set so as to minimize the height. The procedure of test vector modification consists of don't care identification for the test set and a solution to a vertex coloring problem for an incompatibility graph constructed from the test set including don't cares. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce, on average, test data volume and test…

On the effects of test compaction on defect coverage

S.M. Reddy, Irith Pomeranz, Seiji Kajihara

Hardware and Architecture · 23 Dec 2002 · cited 46× · DOI ↗ · more like this ·

We study the effects of test compaction on the defect coverage of test sets for modeled faults. Using a framework proposed earlier, defects are represented by surrogate faults. Within this framework, we show that the defect coverage does not have to be sacrificed by test compaction, if the test set is computed using appropriate test generation objectives. Moreover, two test sets, one compacted and one non-compacted, generated using the same test generation objectives, typically have similar defect coverages, even if the compacted one is significantly smaller than the uncompacted one. Test generation procedures and experimental results to support these claims are presented.

Next-generation visual supercomputing using PC clusters with volume graphics hardware devices

Shigeru Muraki, Masato Ogata, Kwan‐Liu Ma +5 more

Computer Graphics and Computer-Aided Design · 10 Nov 2001 · cited 44× · DOI ↗ · more like this ·

To seek a low-cost, extensible solution for the large-scale data visualization problem, a visual computing system is designed as a result of a collaboration between industry and government research laboratories in Japan, also with participation by researchers in U.S. This scalable system is a commodity PC cluster equipped with the VolumePro 500 volume graphics cards and a specially designed image compositing hardware. Our performance study shows such a system is capable of interactive rendering 5123 and 10243 volume data and highly scalable. In particular, with such a system, simulation and visualization can be performed concurrently which allows scientists to monitor and tune their simulations on the fly. In this paper, both the system and hardware designs are presented.

An evolvable hardware chip and its application as a multi-function prosthetic hand controller

Isamu Kajitani, Tsutomu Hoshino, Nobuki Kajihara +2 more

Artificial Intelligence · National Conference on Artificial Intelligence · 18 Jul 1999 · cited 42× · OpenAlex ↗ · more like this ·

This paper describes the application of genetic al-gorithms to the biomedical engineering problem of a multi-function myoelectric prosthetic hand controller. This is achieved by an innovative LSI chip (EHW chip), i.e., a VLSI implementation of Evolvable Hardware (EHW), which can adapt its own circuit structure to its environment au-tonomously and quickly by using genetic algo-rithms. Usually, a long training period (almost one month) is required before multi-function my-oelectric prosthetic hands can be controlled, how-ever, the EHW chip controller developed here can reduce this period and it has been designed for easy implementation within a prosthetic hand. There are plans to commercialize the prosthetic hand with the EHW chip, and the medical de-partment of Hokkaido University has already de-cided to adopt this for clinical treatment.

On testing of interconnect open defects in combinational logic circuits with stems of large fanout

S.M. Reddy, Irith Pomeranz, Huaxing Tang +2 more

Hardware and Architecture · 25 Jun 2003 · cited 40× · DOI ↗ · more like this ·

We consider the problem of testing of interconnect open defects in combinational circuits with large fanout nodes. We propose a gate level fault model for interconnect opens. The number of interconnect open faults using the proposed model can be very large, being exponential in the fanout size. We describe methods to effectively consider the very large numbers of open faults. These methods include techniques for implicit consideration of open faults, and the use of information about fanout branches driving each primary output to reduce the list of faults. We present experimental results to demonstrate that fault simulation and test generation for the modeled open faults can be carried out efficiently using these techniques.

An efficient method to identify untestable path delay faults

Yun Shao, S.M. Reddy, Seiji Kajihara +1 more

Hardware and Architecture · 14 Nov 2002 · cited 40× · DOI ↗ · more like this ·

Several methods to reduce the run time and memory requirements of a procedure used to efficiently identify untestable path delay faults are proposed in this work. Based on the correlation between the conditions required for sensitizing subpaths in the fan-out-free regions of a circuit, equivalence relations between the subpaths are defined. Equivalence relations are used to reduce the number of subpaths considered in the identification of untestable paths. Dynamic pruning of the potential search space for identifying pairs of subpaths that cannot be sensitized together is used to achieve additional speedup. Results on benchmark circuits show the effectiveness of the proposed methods.