(submitted to IEEE Transactions on Pattern Analysis and Machine Intelligence) Locally linear embedding for classification

Dick De Ridder; Robert P. W. Duin

Computer Science · Computer Vision and Pattern Recognition

(submitted to IEEE Transactions on Pattern Analysis and Machine Intelligence) Locally linear embedding for classification

Dick De Ridder, Robert P. W. Duin

13 August 2008

See on the map

Abstract

Locally linear embedding (LLE) is a recently proposed unsupervised procedure for mapping high-dimensional data nonlinearly to a lower-dimensional space. In this paper, a supervised variation on LLE is proposed. This mapping, when combined with simple classifiers such as the nearest mean classifier, is shown to yield remarkably good classification results in experiments. Furthermore, a number of algorithmic improvements are proposed which should ease application of both traditional and supervised LLE by

(submitted to IEEE Transactions on Pattern Analysis and Machine Intelligence) Locally linear embedding for classification

Abstract

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