Special Session - Test for AI Chips: from DFT to On-line Testing

Abstract

This special session focuses on test for artificial intelligence (AI) chips, with important issues from design for test (DFT) to on-line testing. The first talk discusses different DFT implementations and their tradeoffs as well as test access and configuration infrastructure for AI chips with many cores. The second talk discusses low-cost on-line fault detection and hardware salvaging techniques for neural network processors. The last talk gives case studies for testing industrial AI SOC chips, with an emphasis on the automatic test pattern generation (ATPG) methodology.