I/sub DDQ/ measurement based diagnosis of bridging faults in full scan circuits

Abstract

An algorithm for diagnosing two node bridging faults in static CMOS combinational circuits (full scan circuits) is presented. This algorithm uses results from I/sub DDQ/ testing. The bridging faults considered can be between nodes that are outputs of a gate or internal nodes of gates. Experiments on ISCAS89 circuits show that: I/sub DDQ/ measurement based diagnosis, using a small number of random vectors, is very effective; and it is computationally feasible to diagnose, using I/sub DDQ/ measurement, the large number of all bridging faults.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>